泰克逻辑分析仪探头

准确的数字调试，带有适合特定板或芯片配置的连接。当今高速、低电压数字信号的验证和调试，需要能够从多种电子设计中准确采集并保护信号保真度的探测解决方案。 泰克逻辑分析仪探头包含多种连接选项，其设计保证信号采集能够真实反映设计的性能。 比较和了解更多的泰克逻辑分析仪探头解决方案。

泰克逻辑分析仪探头主要特点

 较低的总电容性负载尽量减少对电路的侵入

 20 kΩ 输入电阻

 7.5 Vp-p动态范围支持范围广泛的逻辑系列

 附加机制多种多样，包括高密度 D-Max®、Mictor、方针和飞脚。

泰克逻辑分析仪探头应用

 数字硬件验证和调试

 监控、测量和优化数字硬件性能

 嵌入式软件集成、调试和验证

用于实时数字系统分析的探头解决方案 – P5900 系列探头

测试和测量解决方案如果不带探测且未考虑其对于系统和测量时间的影响，则不算完整。 凭借行业低的探头加载，P5900 系列逻辑分析仪探头保护信号的完整性，从而尽量减小对于设计的影响。 P5900 系列逻辑分析仪探头在与 TLA6400 系列逻辑分析仪结合使用时，可以经济的价格实现精密的逻辑分析。 请从各种附加机制中进行选择，包括高密度 D-Max®、Mictor 和通用探头。

P5910 17通道通用探头。17 通道 P5910 提供灵活的通用探测，支持 0.100 英寸和 2 毫米引脚间距、低输入电容以及用于连接到许多行业标准连接的附件。与 TLA6400 系列逻辑分析仪兼容。

Verification and debug of today's high speed, low voltage DDR Memory interface signals requires probing solutions that can accurately acquire from a wide variety of form factors and provide excellent signal fidelity. Tektronix logic analyzer probes contain a variety of connectivity options that are engineered to ensure that signal acquisition is a true reflection of your design's performance.

P5910泰克逻辑分析仪探头

• <0.7 pF total capacitive loading minimizes intrusion on circuits
• 20 kΩ input resistance
• 6.5 Vp-p dynamic range supports a broad range of logic families
• General-purpose probing allows flexible attachment to industry- standard connections
• Connectorless probing system eliminates need for onboard connectors

Applications

• DDR3/DDR4 Debug and Verification
• LPDDR Debug and Validation
• Embedded Systems integration, debug, and verification

Leading probe solutions for real-time digital systems analysis

The DDR memory interface has evolved to support higher data rates at lower voltages creating several debug and validation challenges. With the industry's lowest capacitance, the P6900 specialty probes for DDR Memory applications offer excellent signal integrity to ensure a true representation of the signal - critical for connecting to high-speed memory interfaces and performing debug and analysis.
Probes with a variety of attachment mechanisms for different applications are available. Where circuit board space is at a premium, the high-density P6960DBL and P6962DBL probes with D-Max® Probing Technology offers the industry's smallest available footprint. For use with interposers, the P6960HCD, P6960HCD-LV and P6962HCD offer a low profile connection mechanism making it mechanically easy to use with the interposers. For low signal swing application the P6960HS based on the D-Max® Probing Technology is suitable.
For debugging the signal integrity problems common on high-speed DDR buses, the P6900 specialty probes for DDR applications work with the TLA7Bxx modules to provide iCapture™ simultaneous digital-analog acquisition. This allows you to clearly see the time-correlated digital and analog behavior of your design, without the extra capacitance and setup time of double probing.
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